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Your search returned 15 records. Click on the hyperlinks to view further details of Titles.. |
Magazine Name : Ieee Transactions On Reliability
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Year : 2002 Volume number : 51 Issue: 03 |
Analysis Of Incorporating Logistic Testing-Effort Function Into Software Reliability Modeling
(Article)
Subject:
Nonhomogeneous Poisson Process
,
Software Reliability Growth Model
,
Mean Value Function
,
Optimal Software Release Policy
Author:
Chin-Yu
Huang
Sy-Yen
Kuo
page:
261
-
270
Performance Of Parameter-Estimates In Step-Stress Accelerated Life-Tests With Various Sample-Sizes
(Article)
Subject:
Confidence Intervals
,
Cumulative Exposure Model
,
Maximum Likelihood Estimation
,
Accelerated Life Test
Author:
Jye-Chyi
Lu
Ellen Overton
Mcsorley
Chin-Shang
Li
page:
271
-
277
Treatment Of General Dependencies In System Fault-Tree And Risk Analysis
(Article)
Subject:
Common-Cause Failures
,
Fault Trees
,
Implicit Method
,
Explicit Method
Author:
Jussi K
Vaurio
page:
278
-
287
Environmental-Stress-Screening Using Degradation Measurements
(Article)
Subject:
Critical Value
,
Degradation
,
Environmental Stress
,
Life-Cycle-Cost
Author:
Guangbin
Yang
page:
288
-
293
Reliability Databases In Perspective
(Article)
Subject:
Censoring
,
Competing Risk
,
Colored Poisson Process
,
Dependent Competing Risk
Author:
Roger
Cooke
T.
Bedford
page:
294
-
310
A Software-Reliability Growth Model For N-Version Programming Systems
(Article)
Subject:
Non-Homogeneous Poisson Process
,
N-Version Program
,
Software Fault Tolerance
,
Software Reliability Growth Model
Author:
Hoang
Pham
Xiaolin
Teng
page:
311
-
321
Cost-Optimal Condition-Monitoring For Predictive Maintenance Of 2-Phase Systems
(Article)
Subject:
Condition Monitoring
,
Maintenance Cost Optimization
,
Operating Characteristics
,
Predictive Maintenance
Author:
Stephen M.
Pollock
Lisa M.
Maillart
page:
322
-
330
Reliability Tests For Weibull Distribution With Varying Shape-Parameter, Based On Complete Data
(Article)
Subject:
Mean Time To Failure
,
Reliability Testing
,
Weibull Distribution
,
Approximation Of Wilson-Hilferty
Author:
Ikuo
Arizino
Koji
Hisada
page:
331
-
336
Reliability Estimation In A Generalized Life-Model With Application To The Burr-Xii
(Article)
Subject:
Bayes Prediction
,
Burr-Xii Model
,
Lifetime Distributions
,
Lindley Procedure
Author:
Ahmed A.
Soliman
page:
337
-
343
Choosing A Heuristic For The "Fault Tree To Binary Decision Diagram" Conversion, Using Neural Networks
(Article)
Subject:
Binary Decision Diagram
,
Fault-Tree Analysis
,
Neural Networks
,
Variable Ordering Heuristics
Author:
L.M.
Bartlett
John D.
Andrews
page:
344
-
349
Improved Disk-Drive Failure Warnings
(Article)
Subject:
Disk Drive
,
Failure Prediction
,
Magnetic Recording
,
Predictive Failure Analysis
Author:
K
Kreutz-Delgado
Joseph F.
Murray
Gordon F.
Hughes
page:
350
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357
Grobner Bases, Abstract Tubes, And Inclusion-Exclusion Reliability Bounds
(Article)
Subject:
Grobner Bases
,
Reliability Theory
,
Abstract Tubes
Author:
Henry P.
Wynn
Daniel Q.
Naiman
Beatrice
Giglio
page:
358
-
366
Elimination Of Bipolar Induced Drain Breakdown And Single Transistor Latch In Submicron Pd Soi Mosfet
(Article)
Subject:
Floating Body Effects
,
Soi Mosfet
,
Cmos Reliability
,
Drain Breakdown
Author:
M Jagadesh
Kumar
Vikram
Verma
page:
367
-
370
The Availability Of Inspected Systems Subject To Shocks And Graceful Degradation
(Article)
Subject:
Limiting Average-Availability
,
Graceful Degradation
,
Non Self-Announcing Failures
,
Regenerative Process
Author:
Georgia-Ann
Klutke
Yoonjung
Yang
page:
371
-
374
Addendum To: Generic Rules To Evaluate System-Failure Frequency
(Article)
Subject:
System Availability
,
Time-Specific
,
Generic Reuse Model
,
Time-Specific System Failure-Frequency
Author:
Suprasad V.
Amari
page:
378
-
379
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